Download e-book for iPad: Advanced Transmission Electron Microscopy: Imaging and by Jian Min Zuo,John C.H. Spence

By Jian Min Zuo,John C.H. Spence

ISBN-10: 1493966057

ISBN-13: 9781493966059

This quantity expands and updates the assurance within the authors' renowned 1992 booklet, Electron Microdiffraction. because the name implies, the point of interest of the e-book has replaced from electron microdiffraction and convergent beam electron diffraction to all varieties of complex transmission electron microscopy. distinct recognition is given to electron diffraction and imaging, together with high-resolution TEM and STEM imaging, and the applying of those easy methods to crystals, their defects, and nanostructures. The authoritative textual content summarizes and develops many of the necessary wisdom which has been won through the years from the learn of the a number of electron scattering challenge, the new improvement of aberration correctors and their functions to fabrics constitution characterization, in addition to the authors' large instructing event in those components. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is perfect to be used as a sophisticated undergraduate or graduate point textual content in help after all fabrics in fabrics technology, Physics or Chemistry departments.

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Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience by Jian Min Zuo,John C.H. Spence

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